MARC details
| 000 -LEADER |
|---|
| fixed length control field |
03332cam a2200277Ii 4500 |
| INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| ISBN |
9783030815769 |
| INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| ISBN |
3030815765 |
| DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.3815 |
| TITLE STATEMENT |
|---|
| Title |
Reliability of organic compounds in microelectronics and optoelectronics : |
| Remainder of title |
from physics-of-failure to physics-of-degradation / |
| Statement of responsibility, etc |
Willem Dirk van Driel, Maryam Yazdan Mehr, editors |
| Copyright Date |
|---|
| Place of publication |
Cham : |
| Name of publisher |
Springer, |
| Year of publication or production |
[2022] |
| Copyright Date |
|---|
| Year of publication or production |
©2022 |
| Place of publication |
Switzerland |
| Name of publisher |
Cham |
| PHYSICAL DESCRIPTION |
|---|
| Number of Pages |
viii, 550 pages. |
| Other physical details |
illustrations (chiefly color) |
| Accompanying material |
1 online resource : |
| GENERAL NOTE |
|---|
| General note |
Includes index |
| FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Introduction to reliability -- Introduction to failure analysis methodologies -- An overview of remaining life assessment methodologies in engineering materials -- Reliability and failure of microelectronic materials and components in harsh working conditions -- Reliability and failure of solar cell materials and systems in harsh working conditions -- Electromigration-induced failures in microelectronic components -- Corrosion and degradation of metals -- Creep failures in high temperature alloys -- An overview of failures in boilers and heat exchangers in power plants -- Fatigue-related failures -- Degradation and failure of polymers -- Virtual prototyping techniques for prediction material degradation -- Health monitoring, machine learning and digital twin.-Discussions and concluding remarks -- Index |
| SUMMARY, ETC. |
|---|
| Summary, etc |
This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, including microelectronics, automotive, lighting, oil/gas, and petrochemical will benefit from this book. Several case studies and examples are discussed, which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems. Presents methodologies for analysing the reliability, failure, and degradation of different organic materials, used in optoelectronics and microelectronics; Provides an overview of different failure mechanisms in different organic materials; Explains how to correlate product performance and reliability to materials degradation; Provides an overview of simulation techniques and methodologies to predict lifetime and reliability of engineering materials and components; Integrates several degradation causes in different materials (thermal, moisture, light radiation, mechanical damage, and more) into large-scale system solutions in several industrial domains (lighting, automotive, oil/gas, and transport and more); Includes case studies from different failure/degradation mechanisms in different industrial sectors |
| SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Microelectronics |
| SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Optoelectronics |
| SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Functional organic materials |
| SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Functional organic materials |
| ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Driel, Willem Dirk van, |
| ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Yazdan Mehr, Maryam, |
| ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
https://rave.ohiolink.edu/ebooks/ebc2/9783030815769 |
| ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
https://link.springer.com/10.1007/978-3-030-81576-9 |
| ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
http://proxy.ohiolink.edu:9099/login?url=https://link.springer.com/10.1007/978-3-030-81576-9 |
| ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
Library of Congress Classification |
| Koha item type |
Books |